YY-2186 THERMAL SHOCK TEST CHAMBER, TEST METHOD 2 ZONE TYPE OR 3 ZONE TYPE

YY-2186 THERMAL SHOCK TEST CHAMBER, TEST METHOD 2 ZONE TYPE OR 3 ZONE TYPE DETAILS: THE THERMAL SHOCK TEST CHAMBER IS WELL ESTABLISHED TESTING MACHINE OF ELECTRONIC COMPONENTS, METAL, CHEMICAL MATERIALS, AUTOMATION COMPONENTS, COMMUNICATION MODULE, NATIONAL DEFENSE INDUSTRY, AEROSPACE INDUSTRY, PCB SUBSTRATE, ELECTRONIC CHIP INTEGRATED CIRCUITS, SEMICONDUCTOR CERAMIC AND HIGH POLYMER MATERIALS. MEET THE FOLLOWING STANDARDS: GB/T2423.1-1989, GB/T2423.2-1989, GB/R2423.22-1989, GJB150.5-86, GJB360.7-87, GJB367.2-87 405, SJ/T10187-91Y73, SJ/T10186-91Y73, IEC68-2-14, GB/T2424.13-2002, GB/T 2423.22-2002, QC/T17-92, EIA 364-32. QUANTITY: 1
In stock
SKU
YY-2186
Call Image
Call: +1 (864) 574-0404

We will send this product in 2 days. Read more...

Call us now for more info about our products.

Return purchased items and get all your money back.

Buy this product and earn 10 special loyalty points!


REFERENCE NUMBER: YY-2186 THERMAL SHOCK TEST CHAMBER, TEST METHOD 2 ZONE TYPE OR 3 ZONE TYPE DETAILS: THE THERMAL SHOCK TEST CHAMBER IS WELL ESTABLISHED TESTING MACHINE OF ELECTRONIC COMPONENTS, METAL, CHEMICAL MATERIALS, AUTOMATION COMPONENTS, COMMUNICATION MODULE, NATIONAL DEFENSE INDUSTRY, AEROSPACE INDUSTRY, PCB SUBSTRATE, ELECTRONIC CHIP INTEGRATED CIRCUITS, SEMICONDUCTOR CERAMIC AND HIGH POLYMER MATERIALS. MEET THE FOLLOWING STANDARDS: GB/T2423.1-1989, GB/T2423.2-1989, GB/R2423.22-1989, GJB150.5-86, GJB360.7-87, GJB367.2-87 405, SJ/T10187-91Y73, SJ/T10186-91Y73, IEC68-2-14, GB/T2424.13-2002, GB/T 2423.22-2002, QC/T17-92, EIA 364-32. QUANTITY: 1
Write Your Own Review
You're reviewing:YY-2186 THERMAL SHOCK TEST CHAMBER, TEST METHOD 2 ZONE TYPE OR 3 ZONE TYPE