YY-2186 THERMAL SHOCK TEST CHAMBER, TEST METHOD 2 ZONE TYPE OR 3 ZONE TYPE
DETAILS:
THE THERMAL SHOCK TEST CHAMBER IS WELL ESTABLISHED TESTING MACHINE OF ELECTRONIC COMPONENTS, METAL, CHEMICAL MATERIALS, AUTOMATION COMPONENTS, COMMUNICATION MODULE, NATIONAL DEFENSE INDUSTRY, AEROSPACE INDUSTRY, PCB SUBSTRATE, ELECTRONIC CHIP INTEGRATED CIRCUITS, SEMICONDUCTOR CERAMIC AND HIGH POLYMER MATERIALS.
MEET THE FOLLOWING STANDARDS:
GB/T2423.1-1989, GB/T2423.2-1989, GB/R2423.22-1989, GJB150.5-86, GJB360.7-87, GJB367.2-87 405, SJ/T10187-91Y73, SJ/T10186-91Y73, IEC68-2-14, GB/T2424.13-2002, GB/T 2423.22-2002, QC/T17-92, EIA 364-32.
QUANTITY: 1 Learn More
P-2186 THIES LUFT-ROTO PLUS SII DYEING MACHINE YEAR 2007 540 KILOGRAMSREFERENCE NUMBER: P-2186 THIES LUFT-ROTO PLUS SII DYEING MACHINE YEAR 2007 540 KILOGRAMS THIES TYPE: LUFT-ROTO PLUS SII DYEING MACHINE YEAR: 2007 540 KILOGRAMS QUANTITY AVAILABLE: 1 Learn More
YY-2186 THERMAL SHOCK TEST CHAMBER, TEST METHOD 2 ZONE TYPE OR 3 ZONE TYPEYY-2186 THERMAL SHOCK TEST CHAMBER, TEST METHOD 2 ZONE TYPE OR 3 ZONE TYPE DETAILS: THE THERMAL SHOCK TEST CHAMBER IS WELL ESTABLISHED TESTING MACHINE OF ELECTRONIC COMPONENTS, METAL, CHEMICAL MATERIALS, AUTOMATION COMPONENTS, COMMUNICATION MODULE, NATIONAL DEFENSE INDUSTRY, AEROSPACE INDUSTRY, PCB SUBSTRATE, ELECTRONIC CHIP INTEGRATED CIRCUITS, SEMICONDUCTOR CERAMIC AND HIGH POLYMER MATERIALS. MEET THE FOLLOWING STANDARDS: GB/T2423.1-1989, GB/T2423.2-1989, GB/R2423.22-1989, GJB150.5-86, GJB360.7-87, GJB367.2-87 405, SJ/T10187-91Y73, SJ/T10186-91Y73, IEC68-2-14, GB/T2424.13-2002, GB/T 2423.22-2002, QC/T17-92, EIA 364-32. QUANTITY: 1 Learn More